Measurements of the Hall Effect on Cu-As-Se-I Amorphous Thin Films

S. R. Lukic-Petrovic; D. D. Strbac; D. M. Petrovic; G. Stojanovic

doi:10.1380/ejssnt.2012.535

Conference -ICSFS-16-

Measurements of the Hall Effect on Cu-As-Se-I Amorphous Thin Films

S. R. Lukic-Petrovic, D. D. Strbac, D. M. Petrovic, G. Stojanovic

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Keywords: Hall effect, Amorphous thin films, Semiconducting films

JOURNAL FREE ACCESS

2012 Volume 10 Pages 535-537

DOI https://doi.org/10.1380/ejssnt.2012.535

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Abstract

The manuscript reports on measurements of the Hall effect performed on Cu_x(As_38.5Se₅₄I_7.5)_100-x amorphous thin films deposited onto glass substrates. Obtained results showed that conductivity of investigated samples is in the range from 10^-12 Ω^-1cm^-1 to 10^-10 Ω^-1cm^-1. Results also pointed to the switching of p-type conductivity for samples with 0 at% and 5 at% of copper to n-type conductivity detected for sample with 25 at% of copper. [DOI: 10.1380/ejssnt.2012.535]

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