Growth of Ionization Balance from F-like to Bare Ions of Heavy Atoms in an Electron Beam Ion Trap

Jian SUN; Nobuyuki NAKAMURA; Masahide TONA; Chikashi YAMADA; Hirofumi WATANABE; Shunsuke OHTANI; Yunqing FU

doi:10.1585/pfr.3.052

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Growth of Ionization Balance from F-like to Bare Ions of Heavy Atoms in an Electron Beam Ion Trap

Jian SUN, Nobuyuki NAKAMURA, Masahide TONA, Chikashi YAMADA, Hirofumi WATANABE, Shunsuke OHTANI, Yunqing FU

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Keywords: electron beam ion trap, highly charged ion, growth rate, charge state distribution, radiative recombination, x-ray

JOURNAL FREE ACCESS

2008 Volume 3 Pages 052

DOI https://doi.org/10.1585/pfr.3.052

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Abstract

Ionization balance from F-like to bare ions of In and I is investigated as a function of trapping time by measuring extracted ions from an electron beam ion trap, the Tokyo-EBIT. The present experiment is the first clear demonstration of the temporal behavior of the very highly charged ions that have been produced in the EBIT. The growth rate of extracted H-like ions is compared with that of the intensity of the x-ray emission resulting from radiative recombination into the K-shell of H-like ions. The absolute number density of trapped ions was estimated from the intensity of the x-ray emission.

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