電気学会論文誌A(基礎・材料・共通部門誌)
Online ISSN : 1347-5533
Print ISSN : 0385-4205
ISSN-L : 0385-4205
研究開発レター
劣化照射が可能な広エネルギー帯域二次電子放出測定システムの開発
長門 拡渋谷 一晃三宅 弘晃田中 康寛大平 正道奥村 哲平川北 史朗高橋 真人
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2015 年 135 巻 7 号 p. 433-434

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We have developed the secondary electron emission (SEE) with wide energy range for spacecraft thermal control materials. SEE yield measurement is very important for analyzing charge accumulation on the spacecraft surface. Therefore, we are developing the measurement system without the deceleration voltage and enable to obtain the characteristics of the SEE yield on those materials irradiated by an electron beam with energy of 200 eV to 10 keV. Furthermore, SEE yield on the aging materials is also important for determination of end of life of spacecraft. 50 keV electron gun for aging was attached on the developed chamber, we can create the seamless system form the aging to SEE measurement.

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